D1384-XY-aQ120-9
UV Dual Axis AO Deflector
The D1384-XY offers high speed dual axis scanning at 355nm. This deflector consists of two 9mm active aperture AO deflectors mounted orthogonally in one assembly, with independent fine thread Bragg angle adjustment. A half wave plate is included to rotate the input polarization between AO deflectors.
Applications include:
l Material Processing l Drilling l Surface texturing l Micro machining
SPECIFICATIONS
Operating Wavelength:
355 nm (contact Isomet for other UV wavelengths)
Interaction Material:
Quartz
Active Aperture:
9mmH x 9mmW max.
Centre Frequency (x=fc):
120MHz
Sweep Bandwidth:
40MHz
Diffraction Efficiency (DE) at fc:
> 85%, 90% typical per axis
Diffraction Efficiency across scan:
> 75%, 80% typical per axis
RF Power for max’ DE
< 20 Watts total per axis
Static Insertion Loss:
< 4%
Bragg Angle 355nm:
3.7 mrad
Separation Angle at fc:
7.5 mrad
Scan Angle:
2.5 mrad (40MHz sweep).
Input Laser Polarization:
Linear, Vertical w.r.t. to X-axis(Half waveplate included between X & Y axis)
Water Cooling (Minimum):
> 2 Liter/Min. @ < 23ºC
Deflector Performance:
Using 7 x 7mm beam
Total XY Efficiency
~60% across 40MHz scan
Access Time:
1.5µsec
Resolution:
50 x 50 resolvable spots >1000 x 1000 non-resolvable points
TYPICAL SCAN RESPONSE per AXIS
OUTLINE DRAWING
Dim’n: mm
DRIVERS
Synthesizer based: iMS4-L (or –P) programmable synthesizer + (1off) RFA0120-4-15 amplifier
商品属性 [波长] 355 nm [活跃孔径] 9mmH x 9mmW max. [光学材料] Quartz [扫描角] 2.5 mrad (40MHz sweep).