D1384-XY-aQ110-7
High Power Dual Axis AO Deflector
The D1384-XY offers high speed dual axis scanning at 515nm. This deflector consists of two AO deflectors mounted orthogonally in one assembly, with independent fine thread Bragg angle adjustment. A half wave plate is included to rotate the input polarization between AO deflectors. Applications include:
- Material Processing - Drilling - Surface texturing - Micro machining
SPECIFICATIONS
Operating Wavelength:
515 nm (contact Isomet for other VIS wavelengths)
Interaction Material:
Quartz
Active Aperture:
H=7 7mmH x 7mmW
Centre Frequency (x=fc):
110MHz (+/- 5% for best scan response)
Sweep Bandwidth:
30MHz minimum
Diffraction Efficiency (DE) at fc:
> 85%, 90% typical per axis
Diffraction Efficiency across scan:
> 80%, 85% typical per axis
RF Power for max’ DE
< 30 Watts total per axis
Static Insertion Loss:
< 4%
Bragg Angle 515nm:
5.0 mrad
Separation Angle at fc:
9.9 mrad
Scan Angle:
2.7 mrad (30MHz sweep).
Input Laser Polarization:
Linear, Vertical w.r.t. to X-axis
Water Cooling (Minimum):
> 2 Liter/Min. @ < 23ºC
Deflector Performance:
Using 5 x 5mm beam
Total XY Diffraction Efficiency
> 60% across 30MHz scan
Access Time:
0.9µsec
Resolution:
25 x 25 resolvable spots
>1000 x 1000 non-resolvable points(driver dependent)
TYPICAL SCAN RESPONSE per AXIS
OUTLINE DRAWING
Dim’n: mm
商品属性 [波长] 515 nm [活跃孔径] H=7 7mmH x 7mmW [光学材料] Quartz