InGaAs line scan camera
C15333-10E
SWIR (short-wavelength infrared) imaging is a great solution for nondestructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality.
Integrating SWIR imaging into production lines requires cameras such as the C15333-10E InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection.Features
SWIR sensitivity from 950 nm to 1700 nm
1024 pixel linear array
Maximum line rate: 40 kHz
Interface: Employs Gigabit Ethernet
Equipped with high quality images (Back ground subtraction, Real time shading correction)
Applications
Food and agricultural products (damage inspection, quality screening, material discrimination, etc.)
Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.)
Industry (moisture content, leak detection, container inspection, etc.)
Specifications
Type number
C15333-10E
Quantum efficiency
above 60 % (1100 nm ~ 1600 nm) *
Imaging device
InGaAs line sensor
Effective no. of pixels
1024 (H) × 1 (V)
Cell size
12.5 μm (H) × 12.5 μm (V)
Effective area
12.8 mm (H) × 0.0125 mm (V)
Readout speed
Internal mode: 40 kHz (21 μs exposure time)
Sync readout: 40 kHzExposure time
21 μs to 1 s (1 μs step)
External trigger input
Sync readout
External trigger signal routing
12 pin SMA or HIROSE connector
Image processing functions
Background subtraction, Real time shading correction
Interface
Gigabit Ethernet
A/D converter
14 bit
Lens mount
C mount
Power supply
DC 12 V
Power consumption
6 W max.
Ambient operating temperature
0 ℃ to +40 ℃
Ambient storage temperature
-10 ℃ to +50 ℃
Ambient operating humidity
30 % to 80 % (with no condensation)
Ambient storage humidity
90 % max. (with no condensation)
* Representative value
商品属性 [探测器] InGaAs line sensor