Supercontinuum light source Cavity-Ringdown Reflectometer
GLACIER®-C is a further development of our successful GLACIER® reflectometer. GLACIER® allows measuring the losses of optical coatings down to 5 ppm using the extremly sensitive cavity ring-down spectroscopy method. It is therefore often used to characterize highly reflective mirrors where conventional reflection and absorption measurements are insufficient. The innovation of GLACIER®-C is the employment of a super- continuum laser source in combination with a tunable monochromator. This allows a freely selectable wavelength within 450 nm and 2000 nm and, thus, offers an unprecedented flexibility as it is not limited to available diode laser wavelengths. GLACIER®-C combines the unrivalled sensitivity of GLACIER® with a unique wavelength flexibility, creating the most powerful device on the market. The device features high-speed data acquisition and allows to record measurements within seconds. Easy and fast change of wavelength is facilitated through the user friendly software and easy change of optics on kinematic mounts.
Key Product Features
Reflectivity measurements
Reflectivities up to 99.9995%
Various angles of incidence: 5° - 45° (and 0°)
s and p polarization (separately)
Antireflective coating characterization: Reflectivity down to 0.0005% (5 ppm)
Simple and reproducible alignment for 0.5", 1" and 2" optics
Spring-loaded mirror fixtures for reproducible mounting without strain
Computer and user-friendly software interface included
High-speed data acquisition and real-time analysis
Super-continuum laser source and tunable monochromator. Easy and fast change of wavelength
Freely selectable wavelength: 450 - 2000 nm
Footprint: 90 x 55 cm2
A family of GLACIERs to choose from. Pick the one that suits your needs best:
GLACIER
GLACIER-123
GLACIER-C
Number of wavelengths
One
Three
Three*
Maximum number of wavelengths
Three
Four
Unlimited!
Possible to add more wavelengths at a later point
Yes**
Yes**
Yes
Wavelength range
375 — 1550 nm
(diode laser based)355, 532 and 1064 nm
4th wavelength:
diode laser based
(375 — 1550 nm)450 — 2000 nm
(freely selected)Laser source
Diode laser
Microchip laser
Supercontinuum with monochromator
Footprint
90 x 45 cm2
90 x 55 cm2 for more
than 1 wavelength90 x 55 cm2
90 x 55 cm2
Reflectivity measurements
Reflectivities up to 99.9995%
Antireflective coating characterization
Reflectivity down to 0.0005% (5 ppm)
Angle of incidence
5° - 45° and 0°
Polarization
s and p (separately)
Optics size
0.5", 1"
(2” and more upon request)Software
Computer and user-friendly software interface included
*Included in the basic version, more can be added.
**Factory upgrade required. For GLACIER, a bigger footprint should be considered in advance (90 x 55 cm2).
Working Principle
The principle of reflectivity/loss measurements with cavity ring-down spectroscopy is based on very low losses at each mirror bounce. The laser pulses travel inside a cavity experiencing optical losses over and over again during each round trip. The device measures the time-dependent intensity I(t) leaked through an end mirror of the cavity (center). The signal decays with a time constant depending on the intra-cavity losses.
Sketch of the working principle of GLACIER, measurement and fitting procedure.
Light Source
The source consists of a super-continuum laser source and a monochromator. The monochromator is tunable as it employs Acousto Optic Tunable Filters (AOTF). The monochromator comes with two AOTF crystals, each active in separate broad wavelength ranges. The choice of crystals defines the available wavelengths and can be chosen from seven different crystals to fit individual requirements.
Example 1: 640 nm – 1100 nm & 1200 nm – 2000 nm
Example 2: 450 nm – 650 nm & 800 nm – 1400 nm
Sample Measurement
The figures show three typical measurements of high reflective samples and a measurement of an empty cavity (at 1417 nm) where humidity in the cavity causes extra losses. All measurements were recorded using the same GLACIERC device, demonstrating its wavelength flexibility. The losses are obtained by measuring the cavity losses with and without the test sample. This provides an absolute measurement of the test sample.
商品属性 [波长] 450 — 2000 nm