D1340-XY-aQ120-5
UV Dual Axis AO Deflector
The D1340-XY offers high speed dual axis scanning at 355nm. This deflector consists of two AO deflectors mounted orthogonally in one assembly, with independent fine thread Bragg angle adjustment. A half wave plate is included to rotate the input polarization between AO deflectors. Applications include:
l Material Processing l Drilling l Surface texturing l Micro machining
SPECFICATIONS (TYPICAL)
Operating Wavelength:
355 nm (standard)*
Interaction Material:
Quartz
Active Aperture:
H=5 5mmH x 5mmW
Centre Frequency (x=fc):
120MHz
Sweep Bandwidth:
35MHz minimum, 40MHz typical
Diffraction Efficiency (DE) at fc:
> 85%, 90% typical per axis
Diffraction Efficiency across scan:
> 75%, 80% typical per axis
RF Power for max’ DE
< 10 Watts total per axis
Static Insertion Loss:
< 4% per axis
Bragg Angle 355nm:
3.7 mrad
Separation Angle at fc:
7.5 mrad
Scan Angle:
2.5 mrad (40MHz sweep).
Input Laser Polarization:
Linear, Vertical w.r.t. to X-axis
Water Cooling (Minimum):
> 2 Liter/Min. @ < 23ºC
Deflector Performance:
5 x 5mm beam
Total XY Diffraction Efficiency
> 60% across 35MHz scan
Access Time:
0.9µsec
Resolution:
35 x 35 resolvable spots >1000 x 1000 non-resolvable points(driver dependent)
ESTIMATED SCAN RESPONSE per AXIS
*aOptional designs are available for other wavelengths
OUTLINE DRAWING
Dim’n:mm
Refer application note AN1606 regarding Coolant Specification
DRIVERS
iMS4-L ( or –P) programmable synthesizer + RFA0120-4-15 amplifier
商品属性 [波长] 355 nm [活跃孔径] H=5 5mmH x 5mmW [光学材料] Quartz