LS110A-VIS-(C)
Acousto-Optic Deflector
APPLICATIONS
- Solid State Scanning of Visible and Infrared Lasers
FEATURES
- High Resolution
- High Scan Speed
- No Moving Parts
- High Uniformity and Throughput across Scan
OUTLINE DRAWING
SPECIFICATIONS
LS110-442
LS110-500
LS110A-532
LS110-633
Wavelength **:
442nm
488(515)nm
532nm
633nm
Centre Freq. (Nom)
120MHz
100MHz
100MHz z
100MH
Bandwidth ∆f:
50MHz
50MHz
50MHz
50MHz
Scan Angle/Axis:
2.1º
2.3º
(2.4º) 2.5º
2.9º
Separation Angle :
4.9º
4.5º
(4.8º) 4.9º
5.9º
Aperture
9.3mm / 14x4mm
9.3mm / 14x4mm
9.3mm / 14x4mm
9.3mm / 14x4mm
Resolution:
9.3mm Beam (-C)
750
750
750
750
14x4mm Beam
1100*
1100*
1100*
1100*
Aperture:
LS110-xxx-C
9.3mm diameter
LS110-xxx
14mm(W) x 4mm(H)
Access Time (t):
(-C) 9.3mm circular aperture
15 µs
14mm(h)x4mm(w) aperture
22.7µs
Input Laser Polarization:
Linear. (Quarter wave plate included)
Output Laser Polarization:
Circular (Nominal)
Interaction Material:
TeO2 (Slow Shear)
Acoustic Velocity:
0.617mm/µs
RF Input Impedance:
50Ω Nominal
Throughput Efficiency:
>60% Across Scan (75% Typical)
RF DRIVE ELECTRONICS
Fast tuning Synthesizer: iMS4-L (or –P) synthesizer plus 803C-1 amplifiers (x2)
* Theoretical Rayleigh resolution with uniformly illuminated aperture (14mm).
** Please call for other operating wavelengths.
商品属性 [波长] 442nm/488(515)nm/532nm/633nm