OPTICAL THICKNESS GAUGE 157/137 Series
Non-contact thickness measurement for R&D and production applications.
Thickness information is critical in the development and production of a variety of materials. To address this need, Bristol Instruments offers a family of thickness gauge products that employ proven optical technology to provide the most precise and reliable thickness measurement available. What's more, this level of performance is achieved with an unprecedented level of versatility and convenience. These instruments are ideal for applications such as: • Optical Components and Lens Assemblies: measures individual components and multi-element stacks
• OLED, AMOLED, and LCD Displays:
measures total and individual layer thickness including laminating adhesive
• Contact and Intraocular Lenses:
measures center thickness and sagittal height
• Medical Balloon Catheters:
measures wall thickness of body, neck, and cone
• Medical Tubing:
measures wall thickness, outer diameter, and inner diameter
Key Features:
• Measures hard and soft materials without damage or deformation.
• Up to 31 layers can be measured simultaneously.
• Accuracy as high as ± 0.1 μm.
• Long-term measurement repeatability up to ± 0.02 μm.
• Continuous calibration with a built-in standard of length.
• Traceable to NIST standards.
• Broad measurement range of 12 μm to 80 mm.
• Display software provided to control measurement parameters and report thickness data.
• APIs help with integration into a manufacturing process via USB or Ethernet.
• Optional fully integrated optical switch allows for up to eight test stations with a single instrument.
MODEL
157
157LS
157XLS
137
137LS
137XLS
THICKNESS MEASUREMENT
Method
Non-contact optical interferometry
Maximum Physical Thickness
(Layer of air with index of refraction of 1.0)
12 mm
40 mm
80 mm
12 mm
40 mm
80 mm
Maximum Physical Thickness
(Material with index of refraction of 1.5)
8 mm
26 mm
53 mm
8 mm
26 mm
53 mm
Minimum Physical Thickness 1
16 μm
20 μm
24 μm
35 μm
(Material with index of refraction of 1.5)
12 μm
(± 1.0 μm accuracy)
12 μm
(± 1.0 μm accuracy)
16 μm
(± 1.0 μm accuracy)
Accuracy 2
± 0.1 μm
± 1.0 μm
Repeatability 3, 4
± 0.02 μm
± 0.05 μm
Traceability
Verifi ed with NIST certifi ed gauge blocks
Units
mm, μm, mils
MEASUREMENT RATE
20 Hz
7 Hz
4 Hz
20 Hz
7 Hz
4 Hz
INSTRUMENT INTERFACE
USB and Ethernet with Windows-based display program
Ethernet can be used for network connection allowing instrument access to up to 8 clients
Library of commands for LabVIEW, .NET, and custom programming
COMPUTER REQUIREMENTS 5
PC running Windows 10, 1 GB available RAM, USB 2.0 (or later) port, monitor, pointing device
OPTICAL SWITCH 6
Capacity Integrated
1 x 8 fi ber switch
Switch Time 7
1 ms
ENVIRONMENTAL 8
Warm-Up Time
None
Temperature
15°C to +30°C (-10°C to +70°C storage)
Pressure
500 – 900 mm Hg
Humidity
≤ 90% R.H. at + 40°C (no condensation)
DIMENSIONS AND WEIGHT
Dimensions (H x W x D)
3.5" x 17.0" x 15.0" (89 mm x 432 mm x 381 mm)
Weight
17 lbs ( 7.65 kg)
POWER REQUIREMENTS
90 - 264 VAC, 47 - 63 Hz, 80 VA max
WARRANTY
3 Years (parts and labor)
(1) Measurements can be made down to 12 μm (157, 157LS) and 16 μm (157XLS), but with lower accuracy.
(2) Defi ned as measurement uncertainty, or maximum thickness error, with a confi dence level of ≥ 99.7%. Accuracy is verifi ed with NIST Traceable gauge blocks up to 50mm.
(3) Standard deviation for a 60 minute measurement period.
(4) Specifi cation is given for 1 mm sample with an index of refraction of 1.5. Dependent on the refl ectivity of the material under test at the probe wavelength of 1.3 μm. Specifi cation is given at 4% refl ectivity. When refl ectivity is lower, repeatability is reduced to a worst case of about ± 0.15 μm.
(5) Required for initial optical probe alignment and use with the Windows-based display program. Not required for measurement.
(6) Integrated fi ber optic switch included with models 157-8, 157LS-8, 157XLS-8, 137-8, 137LS-8 and 137XLS-8.
(7) Switch time has no effect on system's measurement rate.
(8) Characteristic performance, but non-warranted.
描述 [描述] Non-contact thickness measurement for R&D and production applications.