Soft X-ray / XUV / VUV Spectrograph
Our soft X-ray / XUV / VUV spectrograph features aberration-corrected flatfield imaging and is available with three gratings covering the spectral ranges 1-17 nm (73-1240 eV), 5-80 nm (15- 248 eV) and 30-200 nm (6- 41 eV). In order to maximize light collection, the spectrometer can be used without an entrance slit over a variety of source distances, with 3-17 nm, 10-80 nm and 30- 200 nm spectral coverage. Its modular design is able to match different experimental geometries and configurations.It features an integrated slit holder, gate valve and filter insertion unit, as well as motorized grating positioning along 3 axes.
Key Product Features:
Flat-field grazing-incidence spectrograph
Wavelength coverage with single gratings:
• Soft X-Ray: 1-17 nm (73-1240 eV)
• XUV: 5-80 nm (15-248 eV)
• VUV: 30-200 nm (6-41 eV)
• Motorized three grating version possible
Operation with and without entrance slit
Adapters for different geometry options Integrated gate valve and filter insertion unit
Operating pressure <10-6 mbar Oil-free pump system for stand-alone vacuum operation optionally available
Flexible choice of detectors:X-ray CCD camera or MCP camera system
User-friendly alignment, acquisition and viewer software, including postprocessing tools.
Characteristics:
Grating 1
Grating 2
Grating 3
Wavelength range
1-6 nm
3-17 nm
5-20 nm
10-60 nm
25-80 nm
80-200 nm
30-200 nm
Photon energy range
207-1240 eV
73-413 eV
62-248 eV
21-124 eV
15-50 eV
6-15 eV
6-41 eV
Operation mode
entrance slit
slit-less
entrance slit
slit-less
slit-less
entrance slit
slit-less
Source distance*
any
0.4-0.6 m
any
0.4-0.6 m
0.5-1.5 m
any
2-10 m
Resolution
0.01 nm
0.03 nm
0.02 nm
0.09 nm
0.1 nm
0.05 nm
0.2 nm
* Others on request
Sample Measurement:
As a sample measurement, the image below demonstrates the capabilities of our soft X-ray / XUV /VUV spectrograph and software. It shows the acquired image with a soft X-ray / XUV CCD camera, containing the high harmonic spectrum generated by the interaction of a femtosecond laser pulse with a gas target and subsequent spectral filtering. Post-processing tools are also provided to calibrate, merge and analyse large amount of raw data, as shown below. The final XUV spectrum resolves the finest substructures inherent to the generation process.
Top: Screenshot of our user-friendly software displaying the measurement of high-harmonic generated radiation in the XUV photon range.
Bottom: Corresponding calibrated spectrum in wavelength and energy.
商品属性 [波长范围] 1-200nm [光学分辨率] 0.01-0.2nm