LASER WAVELENGTH METER 871 Series
Fast, accurate, and reliable wavelength measurement of pulsed and CW lasers.
The 871 Series Laser Wavelength Meter from Bristol Instruments uses a proven Fizeau etalon design to measure the wavelength of pulsed and CW lasers to an accuracy as high as ± 0.0001 nm. The system generates a spatial interferogram that is detected by a fast photodetector array. An on-board digital signal processor quickly converts the interferometric information to wavelength resulting in a sustained measurement rate as high as 1 kHz.
Two versions of the 871 Laser Wavelength Meter are available. The model 871A is the most precise, providing an accuracy of ± 0.2 parts per million (± 60 MHz at 1000 nm). For experiments that are less exacting, the model 871B is a lower-priced alternative with an accuracy of ± 0.75 parts per million (± 225 MHz at 1000 nm). Automatic calibration with a built-in wavelength standard guarantees this performance to ensure the most meaningful experimental results.
Key Features:
• Wavelength accuracy up to ± 0.0001 nm.
• Automatic calibration with a built-in wavelength standard.
• Operation available from 375 nm to 2.5 μm.
• Sustained measurement rate of 1 kHz.
• Convenient pre-aligned fifi ber-optic input.
• Asynchronous operation with automatic pulse detection.
• Straightforward operation with a PC using USB or Ethernet.
• Display software provided to control measurement parameters and report wavelength data.
• Built-in PID controller for precise laser stabilization.
• Automatic data reporting using custom or LabVIEW programming eliminates the need for a dedicated PC.
• Convenient tablet/smartphone application reports measurement data anywhere in the laboratory.
• Five-year warranty covers all parts and labor.
MODEL
871A
871B
LASER TYPE
Pulsed and CW
WAVELENGTH
Range
VIS: 375 - 1100 nm
NIR: 630 - 1700 nm
VIS: 375 - 1100 nm
NIR: 630 - 1700 nm
NIR2: 1000 - 2500 nm
Accuracy 1, 2, 3
± 0.2 ppm (single-mode fi ber)
± 0.0002 nm @ 1000 nm
± 60 MHz @ 300,000 GHz
± 0.75 ppm (single-mode fi ber)
± 0.0008 nm @ 1000 nm
± 225 MHz @ 300,000 GHz
± 1 ppm (multi-mode graded-index fi ber ≤ 62.5 μm diameter)
± 0.001 nm @ 1000 nm
± 300 MHz @ 300,000 GHz
Repeatability 4, 5
± 0.0075 ppm
± 0.0075 pm @ 1000 nm
± 2.25 MHz @ 300,000 GHz
± 0.0125 ppm
± 0.0125 pm @ 1000 nm
± 3.75 MHz @ 300,000 GHz
Calibration 6
Automatic with built-in wavelength standard
Display Resolution
9 digits
8 digits
Units 7
nm, μm, cm-1, GHz, THz
OPTICAL INPUT SIGNAL
Maximum Bandwidth (FWHM)
1 GHz
10 GHz
Minimum Input 8, 9, 10, 11
VIS: 3 - 300 nJ
NIR: 50 - 600 nJ
VIS: 3 - 300 nJ
NIR: 30 - 600 nJ
NIR2: 50 - 600 nJ
MEASUREMENT RATE
1 kHz
INPUTS/OUTPUTS
Optical Input 12, 13
Pre-aligned FC/PC fi ber connector (optional free beam-to-fi ber coupler)
Instrument Interface
USB and Ethernet interface with Windows-based display program, and browser-based display application
Streaming via RS-422 (internal or external TTL trigger)
Internal data storage for up to 1 million measurements
Library of commands (SCPI) for custom and LabVIEW programming using any PC operating system
PID controller (± 5 V output)
COMPUTER REQUIREMENTS14
PC running Windows 10, 1 GB available RAM, USB 2.0 (or later) port, monitor, pointing device
ENVIRONMENTAL8
Warm-Up Time < 15 minutes
Temperature | Pressure | Humidity
+15°C to +30°C (-10°C to +70°C storage) | 500 – 900 mm Hg | ≤ 90% R.H. at + 40°C (no condensation)
DIMENSIONS AND WEIGHT
Dimensions (H x W x D)
3.5" x 17.0" x 15.0" (89 mm x 432 mm x 381 mm)
Weight
17 lbs (7.65 kg)
POWER REQUIREMENTS
90 - 264 VAC, 47 - 63 Hz, 50 VA max
WARRANTY
5 Years (parts and labor)
(1) Defifi ned as measurement uncertainty, or maximum wavelength error, with a confifi dence level of ≥ 99.7%.
(2) Traceable to accepted physical standards.
(3) Single-mode input fifi ber must have single-mode performance at the wavelength of the laser under test.
(4) Standard deviation for a 1 minute measurement period after the instrument has reached thermal equilibrium. Standard deviation for a 10 minute period is about twice the 1 minute specififi cation.
(5) Wavelength resolution is approximately two times repeatability.
(6) For VIS version, stabilized single-frequency HeNe laser. For NIR and NIR2 versions, laser diode locked to acetylene absorption (NIST Special Publication 260-133).
(7) Data in units of nm, μm, and cm-1 are given as vacuum values.
(8) Characteristic performance, but non-warranted.
(9) Required minimum energy from a single laser pulse. Greater sensitivity is achieved by increasing the length of the measurement window to allow for the integration of a greater number of laser pulses.
(10) Required minimum power is approximated by multiplying the required minimum energy by the selected measurement rate.
(11) Sensitivity at specififi c wavelengths can be determined from graphs that are provided in the 871 Series Product Details brochure.
(12) Visual inspection and optimization of the interference fringe pattern is not required.
(13) An FC/PC terminated input fifi ber is required. System will not operate with FC/APC terminated fifi ber.
(14) For use with Windows-based display program. Interfacing via SCPI can be done using any PC operating system.
商品属性 [波长范围] VIS: 375 - 1100 nm NIR: 630 - 1700 nm