MS-1780 Laser M² Measuring System
The ModeScan Model 1780 is a laser beam profiling instrument that measures the M² Beam Propagation Ratio and all associated ISO 11146 parameters instantaneously in real time at video rates to over 20Hz. The measurement technique, patented by Photon Inc., uses 10 reflective surfaces to form simultaneous images of the propagating beam at 10 locations on a Model 2512 CCD array camera. With all ten measurement positions acquired at once, the instrument is suitable for measurement of both CW and pulsed lasers down to single-shot rates. Beam diameters are obtained to better than 2% using the BeamPro software. This translates to M² measurements with accuracy to ~5%. The FireWire system operates under Photon’s BeamPro in Microsoft Windows. The compactness of the system and the IEEE 1394a FireWire interface offers enhanced ease-of-use and portability. The ability to operate in any orientation allows for easy placement on any optical bench and saves valuable bench space.
The CCD is sensitive from ~250nm to 1100nm wavelengths. The standard configuration is supplied with a glass OD 2.8 C-mount neutral density filter for wavelengths >360nm, and an OD 3.0 Fused Silica Inconel neutral density filter for wavelengths <360nm. Because of the limited usefulness of exposure control with pulsed lasers, the Photon Inc. Model ATP is recommended for use with pulsed lasers with repetition rate <~10kHz and wavelength >360nm. For pulsed lasers with wavelength <360nm, a variable UV filter or a combination of UV filters will generally be required.
Optical/Sensor/Detector
Sensor
Si CCD 1/2" Format
Wavelength
~360nm – ~1100nm (Standard with OD 2.8 filter)
~250nm – ~1100nm with UV optics
Pixel Array
780 (H) × 580 (V)
Pixel Size
8.3µm × 8.3µm
Array Dimension
6.49mm × 4.83mm
Scanning Mode
Progressive
CCD Cover Glass
Removed
Beam Splitters
Fused Silica: <20/10 Scratch Dig, l/10 Flatness
Test Lenses
UV: ~250 – 460nm
Visible: 425 – 720nm
VIS – NIR: 620 – 1080n
200mm fl Fused Silica/250 – 460nm AR coated standard
200mm fl BK7/425 – 720nm AR coated standard
200mm fl BK7/620 – 1080nm AR coated standard
Fixed Attenuator: Visible – NIR
UV
OD 2.8 Absorbing Glass >360nm
OD 3.0 Fused Silica Inconel 250 – 450nm
Computer/Electrical
A / D Conversion
12 Bit
Maximum Frame Rate
35.8fps (full frame @ full resolution)
Exposure range
20µs–27.64ms (Software selectable via 1394 bus)
Gain
0–12dB (Software selectable via 1394 bus)
Trigger
Internal or External (Software selectable)
External Trigger Specifications
5V ±1V @ 10mA ±5mA (Positive transition)
Trigger Connector
10 pin RJ-45 Jack
Trigger Cable
10 pin RJ-45 to BNC 1.8m
Interface
IEEE 1394a (FireWire)
IEEE 1394 cable
1.8m
Supply Voltage
+8V – +36V DC (+12V DC nominal), <1% ripple (supplied via IEEE 1394 cable); requires external powered hub with laptop PCs
Supply Power
3.5W max @ 12V DC (typical)
Mechanical
Filter/Lens Mount
C-mount (1" – 32 tpi)
Mounting
Gimbal Mount on ½" post; 12mm Metric post optional
Dimensions in mm Weight
62 H × 140 W × 210 L , + Gimbal Mount
Environmental
Operating Temperature
~1.4kg
Humidity
0° – +50°C (+32° – 112F)
Conformity
20% – 80%, relative, non-condensing CE; FCC; RoHS and WEEE
Drawings
Ordering
MS-1780
PH00096
ModeScan Model 1780, dedicated M² measurement system, with 12-bit FireWire (IEEE 1394a) CCD detector for single-shot, pulsed and CW lasers. System includes: ModeScan with gimbaled mount for alignment; FireWire CCD camera; Photon FireWire BeamPro Acquisition and Analysis Software standalone GUI with M² Analysis; Active X automation interface; 200mm lens coated for Visible range (400– 700nm); OD 2.8 glass filter for operation >360nm; Dimensions: 62mm x 140mm x 210mm; For use from 250–1100nm wavelengths - UV and NIR operation will require additional specifically coated optics.
商品属性 [波长] ~250 - ~1100nm [传感器] Silicon CCD