Gauge Block Calibration System
EPP-Series
Design and Operation
The EPP-Series gauge-block calibration system for calibrating parallel-sided gauge blocks employs an LM 20 laser-interferometric gauging probe as its upper gauging probe. It has a measuring range of 20 mm and a length resolution of 1 nm. Investigations conducted by the German national bureau of standards (PTB) yielded metric errors of less than 10 nm for this gauging probe when used for calibrating gauge blocks. According to a PTB recommendation, the total number of reference-standard gauge blocks required for calibrating a 122-piece set of gauge blocks may thus be reduced to fifteen.
A calibration procedure determines system linearity errors (errors due to misalignments, angular misalignments of its gauging probe, and thermal effects) and corrects for them.
The system is easy to operate from a PC running "Parallel Gauge Block Calibration" (PEKAL) signal-processing and control software, which also corrects, processes, and outputs metrological data.
Major Performance Features
• Only around 15 standard gauge blocks are needed for calibrating a 122-block set.
• Cuts calibration costs, thanks to its low recalibration requirements.
• Yields faster measurements, thanks to its menu-driven metrological procedures and the low number of standard gauge blocks required.
• Calibrates unusual nominal sizes and items fabricated from nonstandard materials.
• Features high linearity over its entire measuring range.
• Maintains a constant applied force for the gauging probe over the entire measurement range.
• Supplied complete with stable, high-precision, measuring stands.
• Employs the PEKAL software, which corrects for test object temperature and ambient temperature.
• Optionally available with a set of four temperature sensors.
• Employs a software package running under Windows on any standard PC.
Technical Data EPP 01
Measurement range: 0.5 mm ... 100 mm Upper gauging probe: SIOS Model LM 20 laser-interferometric gauging probe Measurement range: 20 mm Resolution: 1 nm Uncertainty: ≤ ± 10 nm over 15 mm Measurement force: 1 N Probe tip: Interchangeable,1.5-mm radius, spherical,ruby-tipped insert equipped with an M 2.5 external thread Lower gauging probe: Inductive type Measuring force: 0.6 N Probe tip: 1.5-mm radius ball Serial interface: RS 232 C Operating temperature: 20°C ± 0.5 K Resolution of temperature measurement: ± 0.01 K
Applications
• Calibration of plane-parallel gauge blocks with rectangular cross sections ranging from 0.5 mm to 100 mm.
• Measurement characteristic dimensional parameters in compliance with ISO 3650.
Signal-Processing and Control Software
• Controls the motion (raising/lowering) of both gauging probes.
• Simultaneously transmits metrological data obtained by both upper and lower gauging probes.
• Compensates for errors, computes center sizes,recognizes nominal sizes, outputs deviations of center sizes from nominal sizes, and classifies gauge blocks by their degrees of accuracy.
• Reads out signals from the system's online temperature measurement system and compensates for deviations from reference temperatures.
• Outputs custom-designed test reports and certificates