ASD FieldSpec® 4 Hi-Res NG Spectroradiometer
6 nm enhanced SWIR resolution for the next generation of hyperspectral sensors
Higher resolution hyperspectral sensors yield greater precision for remote sensing classification applications, producing more information from every pixel generated in an image than ever before. To help maximize the full potential of these next generation sensors, measurements from ground based instrumentation need to meet or exceed the sensor’s spectral resolution. In the absence of this resolution equality, data is interpolated during post processing and vital spectral information can be smoothed and lost.
The enhanced spectral resolution of the ASD FieldSpec® 4 Hi-Res NG spectroradiometer has been designed to meet the rigorous demands of the next generation hyperspectral imaging systems such as AVRIS-NG and HySpex ODIN-1024. In addition to superior spectral resolution, the ASD FieldSpec 4 Hi-Res NG (like all ASD range spectroradiometers), incorporates graded index InGaAs photodiode SWIR detectors to provide the smallest available spectral sampling interval in a field portable device with 1,875 measured wavelengths over the full 350 to 2,500 nm spectral range, ensuring detection of even the most subtle spectral features.
The ASD FieldSpec 4 Hi-Res NG spectrometer can be used in many industry applications, including:
Asbestos detection
Atmospheric research
Camouflage
Concrete and aggregates
Cosmetics
Crop science
Food and agricultural products
Forestry
General material identification
Geologic mapping
Hyperspectral image ground truthing
Landscape ecology
Multispectral image ground truthing
Pharmaceuticals and nutraceuticals
Photonics
Pigment / color analysis vegetation
Plant physiology
Plastics / petrochemicals
Quantitative analysis
Sensor and radiometric calibration
Snow and ice research
Soil mineralogy
Spectral library creation
Water body / column analysis
技术指标
Spectral Range
350-2500 nm
Spectral Resolution
3 nm @ 700 nm
6 nm @ 1400/2100 nmSpectral Sampling (bandwidth)
1.4 nm @ 350-1000 nm
1.1 nm @ 1001-2500 nmScanning Time
100 milliseconds
Stray light specification
VNIR 0.02%, SWIR 1 & 2 0.01%
Wavelength reproducibility
0.1 nm
Wavelength accuracy
0.5 nm
Maximum radiance
VNIR 2X Solar, SWIR 10X Solar
Channels
2151
Detectors
VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE CooledInput
1.5 m fiber optic (25° field of view). Optional narrower field of view fiber optics available.
Noise Equivalent Radiance (NEdL)
VNIR 1.0 X10-9 W/cm2/nm/sr @700 nm
SWIR 1 8.0 X10-9 W/cm2/nm/sr @ 1400 nm
SWIR 2 8.0 X10-9 W/cm2/nm/sr @ 2100 nmWeight
5.44 kg (12 lbs)
Calibrations
Wavelength, absolute reflectance, radiance*, irradiance*. All calibrations are NIST traceable. (*radiometric calibrations are optional)
Computer
Windows® 7 64-bit laptop (instrument controller)
Warranty
One year full warranty including expert customer support
商品属性 [波长范围] 350-2500 nm [光学分辨率] 3 nm @ 700 nm 6 nm @ 1400/2100 nm