LASER WAVELENGTH METER 671 Series
Reliable accuracy gives you greater confifi dence in your experimental results.
The 671 Series Laser Wavelength Meter from Bristol Instruments uses proven Michelson interferometer-based technology to accurately measure the wavelength of CW lasers that operate from the visible to mid-infrared. Two versions are available. The model 671A is the most precise, measuring wavelength to an accuracy of ± 0.2 parts per million (± 0.0002 nm at 1000 nm). For experiments that are less exacting, the model 671B is a lower-priced alternative with an accuracy of ± 0.75 parts per million (± 0.0008 nm at 1000 nm). To guarantee wavelength measurement accuracy, the 671 Laser Wavelength Meter is continuously calibrated with a built-in HeNe laser. This is an ideal reference source because its wavelength is well-known and fifi xed by fundamental atomic structure. To achieve the highest accuracy, the 671A system uses a single-frequency HeNe laser that is stabilized using a precise balanced longitudinal mode technique. A standard HeNe laser is used as the wavelength reference in the model 671B.
Key Features:
• Wavelength accuracy up to ± 0.0001 nm.
• Continuous calibration with a built-in wavelength standard.
• Operation available from 375 nm to 12 μm.
• Convenient pre-aligned fifi ber-optic input for wavelengths up to 2.6 μm.
• Free-space aperture input with visible alignment aid for IR/mid-IR wavelengths.
• Straightforward operation with a PC using USB or Ethernet.
• Display software provided to control measurement parameters and report wavelength data.
• Automatic data reporting using custom or LabVIEW programming eliminates the need for a dedicated PC.
• Convenient tablet/smartphone application reports measurement data anywhere in the laboratory.
• Five-year warranty covers all parts and labor.
MODEL
671A
671B
LASER TYPE
CW and quasi-CW (repetition rate > 10 MHz)
WAVELENGTH
Range
VIS: 375 - 1100 nm
NIR: 520 - 1700 nm
NIR2: 1 - 2.6 μm
IR: 1 - 5 μm
VIS: 375 - 1100 nm
NIR: 520 - 1700 nm
NIR2: 1 - 2.6 μm
IR: 1 - 5 μm
MIR: 1.5 - 12 μm
Accuracy 1, 2
± 0.2 ppm
± 0.0002 nm @ 1000 nm
± 0.002 cm-1 @ 10,000 cm-1
± 60 MHz @ 300,000 GHz
± 0.75 ppm (± 1 ppm for MIR)
± 0.0008 nm @ 1000 nm
± 0.008 cm-1 @ 10,000 cm-1
± 225 MHz @ 300,000 GHz
Repeatability 3, 4, 5
VIS/NIR/NIR2: ± 0.03 ppm (± 0.03 pm @ 1000 nm)
IR: ± 0.06 ppm (± 0.2 pm @ 3 μm)
± 0.1 ppm (± 0.1 pm @ 1000 nm)
Calibration
Continuous - built-in stabilized single-frequency HeNe laser
Continuous - built-in standard HeNe laser
Display Resolution
9 digits
8 digits
Units 6
nm, μm, cm-1, GHz, THz
POWER (VIS / NIR) 7
Calibration Accuracy
± 15%
Resolution
2%
Units
mW, μW, dBm
OPTICAL INPUT SIGNAL
Maximum Bandwidth 8
1 GHz
10 GHz
Minimum Input 9, 10
VIS: 10 - 500 μW
NIR: 5 - 225 μW
NIR2: 125 - 500 μW
IR: 65 - 750 μW
MIR: 120 - 925 μW
MEASUREMENT RATE
4 Hz (VIS / NIR / NIR2) 2.5 Hz (IR)
10 Hz (VIS / NIR/ NIR2) 2.5 Hz (IR / MIR)
INPUTS/OUTPUTS
Optical Input 11
VIS/NIR: Pre-aligned FC/UPC or FC/APC connector (9 μm core diameter) - optional free beam-to-fi ber couplers
NIR2: Pre-aligned FC/UPC or FC/APC connector (11 μm core diameter) - optional free beam-to-fi ber couplers
IR/MIR: Collimated beam, 2-3 mm diameter aperture, visible tracer beam to facilitate alignment
Instrument Interface
USB and Ethernet interface with Windows-based display program, and browser-based display application
Library of commands (SCPI) for custom and LabVIEW programming using any PC operating system
COMPUTER REQUIREMENTS 12
PC running Windows 10, 1 GB available RAM, USB 2.0 (or later) port, monitor, pointing device
ENVIRONMENTAL10
Warm-Up Time
< 15 minutes
None
Temperature | Pressure | Humidity
+15°C to +30°C (-10°C to +70°C storage) | 500 – 900 mm Hg | ≤ 90% R.H. at + 40°C (no condensation)
DIMENSIONS AND WEIGHT
Dimensions (H x W x D)13
VIS / NIR / NIR2: 5.6” x 6.5” x 15.0”
(142 mm x 165 mm x 381 mm)
IR / MIR: 7.5” x 6.5” x 15.0”
(191 mm x 165 mm x 381 mm)
Weight
14 lbs (6.3 kg)
POWER REQUIREMENTS
90 - 264 VAC, 47 - 63 Hz, 50 VA max
WARRANTY
5 Years (parts and labor)
(1) Defifi ned as measurement uncertainty, or maximum wavelength error, with a confifi dence level of ≥ 99.7%.
(2) Traceable to accepted physical standards.
(3) For 671A, standard deviation for a 10 minute measurement period after the instrument has reached thermal equilibrium.
(4) For 671B, standard deviation for a 1 minute measurement period after the instrument has reached thermal equilibrium. Long-term measurement variations due to longitudinal mode drift of the HeNe reference laser are < ± 0.4 ppm.
(5) Wavelength resolution is approximately two times repeatability.
(6) Data in units of nm, μm, and cm-1 are given as vacuum values.
(7) The NIR2, IR, and MIR versions do not measure absolute power. An intensity meter displays relative power.
(8) Bandwidth is FWHM. When bandwidth is greater, wavelength accuracy is reduced.
(9) Sensitivity at specififi c wavelengths can be determined from a graph provided in the 671 Series Product Details brochure.
(10) Characteristic performance, but non-warranted.
(11) IR and MIR required beam height is 5.4 ± 0.25".
(12) For use with Windows-based display program. Interface with SCPI can be done using any PC operating system.
(13) IR and MIR instrument height is adjustable (7.25 ± 0.25") for alignment purposes.
商品属性 [波长范围] VIS: 375 - 1100 nm NIR: 520 - 1700 nm NIR2: 1 - 2.6 μm IR: 1 - 5 μm