LASER SPECTRUM ANALYZER 771 Series
The most complete laser spectral characterization from the visible to the mid-infrared.
The 771 Series Laser Spectrum Analyzer from Bristol Instruments combines proven Michelson interferometer technology with fast Fourier transform analysis resulting in a unique instrument that operates as both a high-resolution spectrum analyzer and a high-accuracy wavelength meter. With spectral resolution up to 2 GHz, wavelength accuracy as high as ± 0.0001 nm, and an optical rejection ratio of more than 40 dB, the model 771 provides the most detailed information about a laser’s spectral properties. Two versions of the 771 Laser Spectrum Analyzer are available. The model 771A is the most precise, measuring wavelength to an accuracy of ± 0.2 parts per million. For experiments that are less exacting, the model 771B is a lower-priced alternative with an accuracy of ± 0.75 parts per million. Operation of the 771 Laser Spectrum Analyzer is straightforward using a PC connected directly by USB or through a local area network via Ethernet. Software is provided to control measurement parameters, display spectra, and to report wavelength data.
Key Features:
• Spectral analysis and wavelength measurement with one instrument.
• Spectral resolution as high as 2 GHz.
• Wavelength accuracy up to ± 0.0001 nm.
• Continuous calibration with a built-in wavelength standard.
• Optical rejection ratio greater than 40 dB.
• Operation available from 375 nm to 12 μm.
• Operates with CW and high-repetition rate pulsed lasers.
• Convenient pre-aligned fifi ber-optic input for visible/near-IR wavelengths.
• Free-space aperture input with visible alignment aid for IR/mid-IR wavelengths.
• Straightforward operation with a PC using USB or Ethernet.
• Display software provided to control measurement parameters, display spectra, and report wavelength data.
• Five-year warranty covers all parts and labor.
MODEL
771A
771B
LASER TYPE 1
CW, quasi-CW (repetition rate > 10 MHz), and pulsed (repetition rate > 50 kHz, pulse length > 50 ns)
WAVELENGTH
Range 2
VIS: 375 - 1100 nm
NIR: 520 - 1700 nm
IR: 1 - 5 μm
MIR: 1 - 12 μm
Accuracy 3, 4. 5, 6
± 0.2 ppm (± 1 ppm for λ > 5 μm)
± 0.0002 nm @ 1000 nm
± 0.002 cm-1 @ 10,000 cm-1
± 60 MHz @ 300,000 GHz
± 0.75 ppm (± 1 ppm for λ > 5 μm)
± 0.0008 nm @ 1000 nm
± 0.008 cm-1 @ 10,000 cm-1
± 225 MHz @ 300,000 GHz
Spectral Resolution4, 7, 8
4 GHz (for VIS, NIR, MIR)
8 GHz (for IR)
Calibration
Continuous - built-in stabilized single-frequency HeNe laser Continuous - built-in standard HeNe laser
Display Resolution
9 digits
8 digits
Units 9
nm, μm, cm-1, GHz, THz
OPTICAL REJECTION RATIO 4, 10, 11, 12
> 40 dB (> 30 dB for MIR)
MINIMUM INPUT POWER 12, 13, 14
VIS: 0.025 - 1.1 μW
NIR: 0.01 - 0.5 μW
IR: 0.01 - 2.25 μW
MIR: 0.01 - 13 μW
MEASUREMENT TIME 15
< 2 s (1 s with smaller measurement ranges)
INPUTS/OUTPUTS
Optical Input 16
VIS / NIR: Pre-aligned FC/UPC or FC/APC connector (9 μm core diameter) - optional free beam-to-fi ber coupler
IR / MIR: Collimated beam, 2-3 mm diameter aperture, visible tracer beam to facilitate alignment
Instrument Interface
USB and Ethernet with Windows-based display program
Library of commands (SCPI) for custom and LabVIEW programming using any PC operating system
COMPUTER REQUIREMENTS 17
PC running Windows 10, 1 GB available RAM, USB 2.0 (or later) port, monitor, pointing device
ENVIRONMENTAL12
Warm-Up Time
< 15 minutes
None
Temperature | Pressure | Humidity
+15°C to +30°C (-10°C to +70°C storage) | 500 – 900 mm Hg | ≤ 90% R.H. at + 40°C (no condensation)
DIMENSIONS AND WEIGHT
Dimensions (H x W x D)
18 VIS / NIR: 5.6” x 6.5” x 15.0” (142 mm x 165 mm x 381 mm)
IR / MIR: 7.5” x 6.5” x 15.0” (191 mm x 165 mm x 381 mm)
Weight
14 lbs (6.3 kg)
POWER REQUIREMENTS
90 - 264 VAC, 47 - 63 Hz, 50 VA max
WARRANTY
5 Years (parts and labor)
(1) Operation with pulsed lasers may result in modulation artifacts in the form of false spectral features. These modulation artifacts are reduced with averaging.
(2) MIR capable of operation to 14 μm. However, operation and specifi cations are not guaranteed beyond 12 μm.
(3) Defi ned as measurement uncertainty, or maximum wavelength error, with a confi dence level of ≥ 99.7%.
(4) Using Approximate Blackman window function for FFT analysis.
(5) Wavelength Meter Mode: 771A - for laser spectral bandwidth less than 1 GHz (FWHM). 771B - for laser spectral bandwidth less than 10 GHz (FWHM).
(6) Spectrum Analyzer Mode: wavelength axis is calibrated to system’s accuracy specifi cation.
(7) Defi ned as the measured full width at half maximum intensity (FWHM) of an infi nitely narrow optical signal.
(8) Spectral resolution as high as 2 GHz (4 GHZ for IR) can be achieved using other window functions. However, wavelength accuracy and optical rejection ratio may be reduced.
(9) Data in units of nm, μm, and cm-1 are given as vacuum values.
(10) For single measurement with CW lasers, FWHM < 10 GHz, and 10,000 times (1,000 times for MIR) minimum input power.
(11) A co-addition averaging feature can be used to reduce the noise level and therefore improve the optical rejection ratio.
(12) Characteristic performance, but non-warranted.
(13) Optical power required to achieve a signal-to-noise ratio of approximately 1 dB.
(14) Sensitivity at specifi c wavelengths can be determined from a graph provided in the 771 Series Product Details brochure.
(15) Time to generate a spectrum over the entire operational wavelength range. Smaller ranges are available to reduce measurement time to 1 s.
(16) IR and MIR required beam height is 5.4 ± 0.25”.
(17) For use with Windows-based display program. Interface with SCPI can be done using any PC operating system.
(18) IR and MIR instrument height is adjustable (7.25 ± 0.25”) for alignment purposes.
商品属性 [波长范围] VIS: 375 - 1100 nm NIR: 520 - 1700 nm IR: 1 - 5 μm MIR: 1 - 12 μm